PATIL, Jayashri Jagannath; SURYAWANSHI, Nilesh Ashok. Deep Feature Extraction Techniques For Machine Learning-Based Digital Image Steganalysis. International Journal of Artificial Intelligence and Machine Learning, [S. l.], v. 6, n. 7s, p. 1102–1120, 2026. DOI: 10.51483/IJAIML.6.7s.2026.1102-1120. Disponível em: https://www.svedbergopen.com/index.php/ijaiml/article/view/1170. Acesso em: 13 sep. 2026.