BIRLE, Vandana; SOLANKI, Dr. Dilip Singh. From Orbit to Leaf: A Critical Systematic Review of Artificial Intelligence for Multi-Scale Crop Monitoring and Soybean Leaf Disease Diagnosis. International Journal of Artificial Intelligence and Machine Learning, [S. l.], v. 6, n. 9s, p. 471–498, 2026. Disponível em: https://www.svedbergopen.com/index.php/ijaiml/article/view/1516. Acesso em: 6 sep. 2026.