KAKARLA, Venu Gopal. Closed-Loop Order Risk Monitoring Using Statistical Learning and Operational Write-Back. International Journal of Artificial Intelligence and Machine Learning, [S. l.], v. 6, n. 13s, p. 1409–1416, 2026. Disponível em: https://www.svedbergopen.com/index.php/ijaiml/article/view/2852. Acesso em: 10 oct. 2026.