Kakarla, Venu Gopal. “Closed-Loop Order Risk Monitoring Using Statistical Learning and Operational Write-Back”. International Journal of Artificial Intelligence and Machine Learning 6, no. 13s (October 5, 2026): 1409–1416. Accessed October 10, 2026. https://www.svedbergopen.com/index.php/ijaiml/article/view/2852.